AFM cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by the tapping AFM tip. AFM probes with coatings can also be used in conductive AFM techniques.
A wear-resistant coating with thickness 20 nm is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
This AFM probe features alignment grooves on the back side of the holder chip.
