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Quantity
HQ:CSC17/No Al-15 Box of 15 AFM Probes
320.00 EUR
HQ:CSC17/No Al-50 Box of 50 AFM Probes
900.00 EUR
Your volume discount is 166.67 EUR or 15.60%
HQ:CSC17/No Al-100 Box of 100 AFM Probes
1700.00 EUR
Your volume discount is 433.33 EUR or 20.30%
HQ:CSC17/No Al-200 Box of 200 AFM Probes
3200.00 EUR
Your volume discount is 1066.67 EUR or 25.00%
HQ:CSC17/No Al-400 Box of 400 AFM Probes
4990.00 EUR
Your volume discount is 3543.33 EUR or 41.50%
Product availability: On stock
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HQ:CSC17/No Al

Standard Contact Mode AFM Probe

Manufacturer: MikroMasch

Coating: none
AFM tip shape: Rotated
AFM Cantilever
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values
Applications
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AFM cantilevers of the 17 series with low force constant offer high sensitivity in contact mode AFM. These AFM cantilevers are also used for Lateral Force Microscopy.

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • 450 µm (445 - 455 µm)*
  • 50 µm (47 - 53 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range
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