TESP-SS

NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping™ mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced AFM tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

This AFM probe offers unique features:

• excellent tip radius of curvature
• guaranteed tip radius of curvature 5 nm (yield >80%)

 
This AFM probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original AFM probe which has always been manufactured by NanoWorld®.

This AFM probe features alignment grooves on the back side of the holder chip.