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SSS-FMR

Order Code / Price*

Quantity

SSS-FMR-10 Box of 10 AFM Probes

776 776.00 EUR

Volume Discount Available [?]

SSS-FMR-20 Box of 20 AFM Probes

1389 1389.00 EUR

Your volume discount is 163.00 EUR or 10.50%

SSS-FMR-50 Box of 50 AFM Probes

3060 3060.00 EUR

Your volume discount is 820.00 EUR or 21.10%

Product availability: On stock

Close-up view SEM image of SuperSharpSilicon AFM tip

SSS-FMR

Name: SSS-FMR-10 SuperSharp, Force Modulation AFM Probe
Brand: NANOSENSORS
SKU: SSS-FMR-10
Price: 776 EUR
Availability: InStock

SuperSharp, Force Modulation AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: Supersharp

AFM Cantilever

F 75 kHz

C 2.8 N/m

L 225 µm

*nominal values

Applications

Supersharp AFM Probes

How to optimize AFM scan parameters

NANOSENSORS™ SSS-FMR AFM probes are designed for force modulation mode.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FMR AFM tip serves also as a basis for high resolution AFM tips with magnetic coating SSS-MFMR. Furthermore non-contact or tapping mode operation is possible with the FM AFM tip but with reduced operation stability.

The AFM probe offers unique features:

excellent AFM tip radius of curvature
typical aspect ratio at 200 nm from AFM tip apex in the order of 4:1
monolithic material
highly doped silicon to dissipate static charge
chemically inert
high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Supersharp

Radius: < 2 nm (< 5 nm guaranteed)

Half Cone Angle: < 10° at 200 nm from apex

AFM Cantilever:

Shape: Beam

Force Constant: 2.8 N/m (0.5 - 9.5 N/m)*

Resonance Frequency: 75 kHz (45 - 115 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 30 µm (20 - 35 µm)*

Thickness: 3 µm ( 2 - 4 µm)*

* guaranteed range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.