SSS-FM

NANOSENSORS™ SSS-FM AFM probes are designed for force modulation mode.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FM AFM tip serves also as a basis for high resolution AFM tips with magnetic coatings SSS-MFMR. Furthermore non-contact or tapping mode operation is possible with the FM AFM tip but with reduced operation stability.

The AFM probe offers unique features:

• excellent AFM tip radius of curvature
• typical aspect ratio at 200 nm from AFM tip apex in the order of 4:1
• monolithic material
• highly doped to dissipate static charge
• chemically inert
• high mechanical Q-factor for high sensitivity