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PPP-LFMR

Order Code / Price*

Quantity

PPP-LFMR-10 Box of 10 AFM Probes

328 328.00 EUR

Volume Discount Available [?]

PPP-LFMR-20 Box of 20 AFM Probes

587 587.00 EUR

Your volume discount is 69.00 EUR or 10.50%

PPP-LFMR-50 Box of 50 AFM Probes

1296 1296.00 EUR

Your volume discount is 344.00 EUR or 21.00%

PPP-LFMR-W Box of 380 AFM Probes

6802 6802.00 EUR

Your volume discount is 5662.00 EUR or 45.40%

Product availability: On stock

Front view SEM image of PointProbe® Plus AFM tip

Close-up view SEM image of PointProbe® Plus AFM tip

PPP-LFMR

Name: PPP-LFMR-10 Standard Lateral Force Mode AFM Probes
Brand: NANOSENSORS
SKU: PPP-LFMR-10
Price: 328 EUR
Availability: InStock

best of the best

Standard Lateral Force Mode AFM Probes

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: Standard

AFM Cantilever

F 23 kHz

C 0.2 N/m

L 225 µm

*nominal values

Applications

Lateral Force Microscopy (LFM) AFM Probes

How to optimize AFM scan parameters

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

For lateral or friction force microscopy NANOSENSORS™ offers a special type of AFM probe (LFM: lateral force microscopy). This sensor type is optimized for a high sensitivity to lateral or friction forces by an extremely soft, thin AFM cantilever.

The AFM probe offers unique features:

excellent AFM tip radius of curvature
highly doped silicon to dissipate static charge
Al coating on detector side of AFM cantilever
high mechanical Q-factor for high sensitivity
precise alignment of the AFM cantilever position (within +/-2µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 7 nm (< 10 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.01 - 1.87 N/m)*

Resonance Frequency: 23 kHz (1 - 57 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 48 µm (40 - 55 µm)*

Thickness: 1 µm ( 0.1 - 2 µm)*

* guaranteed range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.