PPP-EFM

The PointProbe®Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

The PPP-EFM AFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the AFM cantilever increasing the electrical conductivity of the AFM tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

The AFM probe offers unique features:

• metallic conductivity of the AFM tip
• high mechanical Q-factor for high sensitivity
• precise alignment of the AFM cantilever position (within +/-2µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

Please note:

• Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.
• Although this is possible, it is not recommended to use PtIr5 coated AFM tips for electrical contacting in applications where it is necessary to conduct high current. The very thin layer of PtIr5 is unable to support much current.

This AFM probe features alignment grooves on the back side of the holder chip.