The OLYMPUS OMCL-AC55TS series silicon AFM probes feature an AFM tip with ‘TipView structure’ that makes it easy to estimate the position of the AFM tip relative to the sample measurement site. The sharpened, tetrahedral, point-terminated AFM tip has very good symmetry when viewed from the front and is inclined when viewed from the side.
The OLYMPUS OMCL-AC55TS AFM cantilever offers a high resonance frequency in the megahertz range and low thermal noise allowing high-speed, high-resolution measurements of liquid-solid interfaces, etc.
The back side of the AFM cantilever is coated with a thin gold reflective coating.
The parallel sidewalls of the holder chip make handling with tweezers easy and eliminate problems with chipping and debris. The holder chip does not feature alignment grooves.
