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NCSTR

Order Code / Price*

Quantity

NCSTR-10 Box of 10 AFM Probes

311 311.00 EUR

Volume Discount Available [?]

NCSTR-20 Box of 20 AFM Probes

556 556.00 EUR

Your volume discount is 66.00 EUR or 10.60%

NCSTR-50 Box of 50 AFM Probes

1226 1226.00 EUR

Your volume discount is 329.00 EUR or 21.20%

NCSTR-W Box of 380 AFM Probes

6528 6528.00 EUR

Your volume discount is 5290.00 EUR or 44.80%

Product availability: On stock

SEM image of PointProbe® Plus AFM tip

NCSTR

Name: NCSTR-10 Soft Tapping Mode AFM Probe
Brand: NanoWorld
SKU: NCSTR-10
Price: 311 EUR
Availability: InStock

the industry standard

Soft Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: Reflective Aluminum
AFM tip shape: Standard

AFM Cantilever

F 160 kHz

C 7.4 N/m

L 150 µm

*nominal values

Applications

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

NanoWorld Pointprobe® NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, AFM tip and sample wear could be significantly decreased.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

For applications requiring lower resonance frequencies or a AFM cantilever length exceeding 150 µm use NanoWorld Pointprobe® type NCLR. For standard non-contact / tapping mode application use NanoWorld Pointprobe® type NCHR.

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

AFM Tip:

Shape: Standard

Radius: < 8 nm (< 12 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 7.4 N/m (3 - 16 N/m)*

Resonance Frequency: 160 kHz (120 - 205 kHz)*

Length: 150 µm (145 - 155 µm)*

Width: 27 µm (22 - 32 µm)*

Thickness: 2.8 µm ( 2.3 - 3.3 µm)*

* typical range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.