NANOSENSORS™ DT-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. The CONT type is optimized for high sensitivity due to a low force constant.
For applications that require hard contact between AFM tip and sample this AFM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
The AFM probe offers unique features:
This AFM probe features alignment grooves on the back side of the holder chip.
The DT Diamond Coating is an approximately 100 nm thick coating of polycrystalline diamond on the tip-side of the AFM cantilever leading to an unsurpassed hardness of the AFM tip. The Raman spectrum of the coating verifies the real diamond coating.
The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
