Ultra High Frequency AFM Probe with Tip at the Very End of the Cantilever
Ultra High Frequency – Au Coating (Detector Side)
Optimized positioning through maximized tip visibility
NanoWorld Arrow™ ultra high frequency AFM probes are capable of resonating with a very high frequency (typically around 2.0 MHz). This AFM probe type combines outstanding sensitivity with fast scanning ability.
All AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM probes feature an AFM cantilever with a triangular free end and a tetrahedral AFM tip with a height of 3 µm.
Additionally, this AFM probe offers an excellent radius of curvature.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the AFM tip on the area of interest.
If needed, specific AFM cantilever thicknesses can be selected within very narrow tolerances for an additional fee.
