  CP-CONT-Au
|
Special Contact Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
|
|
CP-CONT-BSG
|
Special Contact Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
|
|
CP-CONT-PM
|
Special Contact Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
|
|
CP-CONT-PS
|
Special Contact Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
|
|
CP-CONT-SiO
|
Special Contact Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
|
|
CP-FM-Au
|
Special Force Modulation AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
|
CP-FM-BSG
|
Special Force Modulation AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
|
CP-FM-PM
|
Special Force Modulation AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
|
CP-FM-PS
|
Special Force Modulation AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
|
CP-FM-SiO
|
Special Force Modulation AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
|
CP-NCH-Au
|
Special Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
|
|
CP-NCH-BSG
|
Special Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
|
|
CP-NCH-PM
|
Special Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
|
|
CP-NCH-PS
|
Special Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
|
|
CP-NCH-SiO
|
Special Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
|
|
CP-PNP-Au
|
Special Silicon Nitride AFM Probe
|
- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm
force const.: 0.32 N/m
res. freq.: 67 kHz
Cantilever 2:
length: 200 µm
force const.: 0.08 N/m
res. freq.: 17 kHz
|
|
|
CP-PNP-BSG
|
Special Silicon Nitride AFM Probe
|
- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm
force const.: 0.32 N/m
res. freq.: 67 kHz
Cantilever 2:
length: 200 µm
force const.: 0.08 N/m
res. freq.: 17 kHz
|
|
|
CP-PNP-PM
|
Special Silicon Nitride AFM Probe
|
- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm
force const.: 0.32 N/m
res. freq.: 67 kHz
Cantilever 2:
length: 200 µm
force const.: 0.08 N/m
res. freq.: 17 kHz
|
|
|
CP-PNP-PS
|
Special Silicon Nitride AFM Probe
|
- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm
force const.: 0.32 N/m
res. freq.: 67 kHz
Cantilever 2:
length: 200 µm
force const.: 0.08 N/m
res. freq.: 17 kHz
|
|
|
CP-PNP-SiO
|
Special Silicon Nitride AFM Probe
|
- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm
force const.: 0.32 N/m
res. freq.: 67 kHz
Cantilever 2:
length: 200 µm
force const.: 0.08 N/m
res. freq.: 17 kHz
|
|
|
AFM Probes