  B100_CONTR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
|
|
B100_FMR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
|
B100_NCHR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
|
|
B150_CONTR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
|
|
B150_FMR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
|
B150_NCHR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
|
|
B1_CONTR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
|
|
B1_FMR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
|
B1_NCHR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
|
|
B2_CONTR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
|
|
B2_FMR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
|
B2_NCHR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
|
|
B50_CONTR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
|
|
B50_FMR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
|
B50_NCHR
|
Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
|
 biotool_PNP-TR_10
|
Soft Contact AFM Probe for Biological Applications
|
- Coating:
Reflex Gold
- Tip Shape:
Cone Shaped, EBD, High-Aspect-Ratio, Supersharp
- Cantilever:
length: 100 µm
force const.: 0.32 N/m
res. freq.: 67 kHz
|
|
 CDR130-EBD
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, Cylindrical, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
|
|
|
CDR50-EBD
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, Cylindrical, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
|
|
|
CDR70-EBD
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, Cylindrical, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
|
|
 CNT100_ArrowNCR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
|
|
 CNT300_ArrowNCR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
|
|
|
CNT500_ArrowNCR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
|
|
 EBD2-100_NCHR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
|
|
EBD2-100_NCH_13
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
|
|
EBD2-100_NCH_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
|
 M1-ESD_NCH_13
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Antistatic Aluminium Coating
- Tip Shape:
Cone Shaped
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
|
 M1_NCH_13
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
|
 MC90-70_ArrowNCR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, Cylindrical, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
|
|
 MSS_FMR_13
|
SuperSharp, Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Supersharp
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
|
MSS_FMR_3
|
Standard Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Supersharp
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
 MSS_NCHR_13
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, High-Aspect-Ratio, Supersharp
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
|
|
MSS_NCHR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, High-Aspect-Ratio, Supersharp
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
|
|
SSE_FMR_13
|
SuperSharp, Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Supersharp
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
|
 SSE_NCHR_13
|
SuperSharp, Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Supersharp
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
|
|
AFM Probes