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AFM Calibration Standards
Probe Tip Characterizer
manufacturer
Team Nanotec®
IVPS
Line with vertical, parallel sidewalls
Layout
88 cells on 1 x 1 mm area
on 6 x 6 silicon chip
Specification
Material:
silicon
Width of line:
800nm ± 15%
Depth of line:
1µm ± 15%
Surface/sidewall angle:
90° ± 0.5°
Sidewall parallelity:
< 1°
Top corner radius:
< 10nm
Bottom corner radius:
< 25nm
Edge roughness:
< 5nm
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