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 AFM Calibration Standards
Probe Tip Characterizer
manufacturer  Team Nanotec®
IVPS IVPS
Line with vertical, parallel sidewalls
Layout
88 cells on 1 x 1 mm area
on 6 x 6 silicon chip
Specification
Material: silicon
Width of line: 800nm ± 15%
Depth of line: 1µm ± 15%
Surface/sidewall angle: 90° ± 0.5°
Sidewall parallelity: < 1°
Top corner radius: < 10nm
Bottom corner radius: < 25nm
Edge roughness: < 5nm


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