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 AFM Calibration Standards
Probe Tip Characterizer
manufacturer  Team Nanotec®
ISNE ISNE
Sharp silicon "nanoedge"
with sleep slope angles
Layout
88 cells on 1 x 1 mm area
on 6 x 6 silicon chip
Specification
edge recesed against top surface
useable edge lenght: < 2 microns
top edge radius: < 10nm
edge width variation: 3nm (3 sigma)
upper slope angle:

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