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AFM Calibration Standards
Probe Tip Characterizer
manufacturer
Team Nanotec®
ISNE
Sharp silicon "nanoedge"
with sleep slope angles
Layout
88 cells on 1 x 1 mm area
on 6 x 6 silicon chip
Specification
edge recesed against top surface
useable edge lenght:
< 2 microns
top edge radius:
< 10nm
edge width variation:
3nm (3 sigma)
upper slope angle:
8°
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