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AFM Calibration Standards
Probe Tip Characterizer
manufacturer
Team Nanotec®
IFSR
Line with sharp, overhanging edges
Layout
88 cells on 1 x 1 mm area
on 6 x 6 silicon chip
Specification
Material:
silicon
Width of line:
2 to 2.5 mu
Depth of line:
> 4 mu
Overhang:
> 250nm
Overhang slope angle:
35°
Edge radius:
< 10nm
Edge roughness:
< 10nm
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