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 AFM Calibration Standards
Probe Tip Characterizer
manufacturer  Team Nanotec®
IFSR IFSR
Line with sharp, overhanging edges
Layout
88 cells on 1 x 1 mm area
on 6 x 6 silicon chip
Specification
Material: silicon
Width of line: 2 to 2.5 mu
Depth of line: > 4 mu
Overhang: > 250nm
Overhang slope angle: 35°
Edge radius: < 10nm
Edge roughness: < 10nm


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