AFM probes, Atomic Force Microscope tips, AFM probe

Application Modes:

Non-Contact / Tapping Mode AFM Probes

Force Modulation Mode AFM Probes (FM)

Contact Mode AFM Probes

AFM Probes for Electrostatic Force Microscopy (EFM) / Electrical AFM Measurements (Tuna, SSR, SCM)

Magnetic Force Microscopy AFM Probes (MFM)

Lateral Force Microscopy AFM Probes (LFM)

Enhanced Resolution Imaging AFM Tips (Super Sharp Silicon, SSS Tips)

Trench / High Aspect Measurement AFM Tips

Diamond coated, Hardened, Nanoindentation AFM Tips

AFM Probes for Biological Applications / Soft Contact Measurements

Tipless AFM Cantilevers and AFM Cantilever Arrays

Silicon Nitride AFM Probes

Premounted AFM Probes

Plateau AFM Tips

Self-Sensing & Self-Actuating AFM Probes

Enhanced Wear Resistance Non-Conductive

Sphere AFM Tips

Colloidal Probes

Search by FC/RF nominal values:

Force Constant:

from: to: N/m

* valid range: from: 0.000to: 140.000N/m

Resonant Frequency:
(first harmonic)

from: to: kHz

* valid range: from: 0.0to: 1500.0kHz

Cantilever Shape:

Tip Shape:

AFM Probe Coating:

Tip Side:

Detector Side:

AFM Probes, Tips, Cantilevers

Advanced AFM Probes Search

new search » « refine your search

Advanced Search Filter: Select application modes and refine your search by specs or manufacturer.

Application Modes:

Search by FC/RF nominal values:

Force Constant:

Resonant Frequency:
(first harmonic)

AFM Probe Coating:

Manufacturer:

AFM Probes, Tips, Cantilevers

Advanced AFM Probes Search

new search » « refine your search

Advanced Search Filter: Select application modes and refine your search by specs or manufacturer.

Application Modes:

Search by FC/RF nominal values:

Force Constant:

Resonant Frequency:(first harmonic)

AFM Probe Coating:

Manufacturer:

Resonant Frequency:
(first harmonic)