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 B2_FMR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz
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 B50_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
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 B100_FMR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz
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 B150_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 B1_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
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 B1_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 B2_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
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 B2_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 B50_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 B100_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
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 B100_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 B150_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
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 B150_FMR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz
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 CP-CONT-Au
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Special Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CP-CONT-BSG
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Special Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CP-CONT-PM
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Special Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CP-CONT-PS
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Special Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CP-CONT-SiO
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Special Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 450 µm force const.: 0.2 N/m res. freq.: 13 kHz
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 CP-FM-Au
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Special Force Modulation AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz
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 CP-FM-BSG
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Special Force Modulation AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz
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 CP-FM-PM
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Special Force Modulation AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz
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 CP-FM-PS
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Special Force Modulation AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz
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 CP-FM-SiO
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Special Force Modulation AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz
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 CP-NCH-Au
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Special Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
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 CP-NCH-BSG
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Special Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
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 CP-NCH-PM
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Standard Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
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 CP-NCH-PS
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Special Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
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 CP-NCH-SiO
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Special Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
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 CP-PNP-Au
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Special Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm force const.: 0.32 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.08 N/m res. freq.: 17 kHz
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 CP-PNP-BSG
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Special Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm force const.: 0.32 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.08 N/m res. freq.: 17 kHz
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 CP-PNP-PM
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Special Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm force const.: 0.32 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.08 N/m res. freq.: 17 kHz
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 CP-PNP-PS
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Special Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm force const.: 0.32 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.08 N/m res. freq.: 17 kHz
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 CP-PNP-SiO
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Special Silicon Nitride AFM Probe
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- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilever 1:
length: 100 µm force const.: 0.32 N/m res. freq.: 67 kHz
Cantilever 2: length: 200 µm force const.: 0.08 N/m res. freq.: 17 kHz
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