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  DT-NCHR
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Diamond Coated Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
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 NW-DT-NCHR
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Diamond Coated Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
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DT-NCLR
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Diamond Coated Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
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 B1_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
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B50_FMR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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B100_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
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NW-DT-NCLR
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Diamond Coated Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
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DT-FMR
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Diamond Coated Force Modulation AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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NW-DT-FMR
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Diamond Coated Force Modulation AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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DT-CONTR
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Diamond Coated Contact Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
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 Tap300DLC
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Diamond-Like-Carbon Coated Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
length: 125 µm
force const.: 40 N/m
res. freq.: 300 kHz
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Tap190DLC
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Diamond-Like-Carbon Coated Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
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Tap150DLC
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Diamond-Like-Carbon Coated Soft Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
length: 125 µm
force const.: 5 N/m
res. freq.: 150 kHz
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Multi75DLC
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Diamond-Like-Carbon Coated Force Modulation AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
length: 225 µm
force const.: 3 N/m
res. freq.: 75 kHz
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ContDLC
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Diamond-Like-Carbon Coated Contact Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
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 BudgetComboBox
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Mixed Box with 50 BudgetSensors AFM probes of your choice
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CDT-NCHR
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Diamond Coated, Conductive Tapping Mode AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
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 CDTP-NCHR
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Diamond Coated, Conductive Tapping Mode AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
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NW-CDT-NCHR
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Diamond Coated, Conductive Tapping Mode AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
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DDESP
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Diamond Coated, Conductive Tapping Mode AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
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CDT-NCLR
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Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
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NW-CDT-NCLR
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Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
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CDT-FMR
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Diamond Coated, Conductive Force Modulation AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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NW-CDT-FMR
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Diamond Coated, Conductive Force Modulation AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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DDESP-FM
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Diamond Coated, Conductive Force Modulation AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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CDT-CONTR
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Diamond Coated, Conductive Contact Mode AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
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B1_FMR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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B1_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
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B2_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
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B2_FMR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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B2_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
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B50_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
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B50_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
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B100_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
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B100_FMR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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B150_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
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B150_FMR
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Special Nanoindentation AFM probe
|
- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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B150_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Rotated, Sphere, Standard
- Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
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 CNT100_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
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 CNT300_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
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CNT500_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
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 M1-ESD_NCH_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Antistatic Aluminium Coating
- Tip Shape:
Cone Shaped
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
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 EBD2-100_NCHR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
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EBD2-100_NCH_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
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EBD2-100_NCH_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
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 M1_NCH_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
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 CDR130-EBD
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, Cylindrical, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
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CDR50-EBD
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, Cylindrical, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
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CDR70-EBD
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, Cylindrical, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
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 MC90-70_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
Arrow, Cylindrical, EBD, High-Aspect-Ratio
- Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
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 MSS_NCHR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, High-Aspect-Ratio, Supersharp
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
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 MSS_FMR_13
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Supersharp
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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MSS_FMR_3
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Supersharp
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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SSE_FMR_13
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Supersharp
- Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
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 SSE_NCHR_13
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, Supersharp
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
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MSS_NCHR_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminum
- Tip Shape:
EBD, High-Aspect-Ratio, Supersharp
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
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  CP-NCH-BSG
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Special Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
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CP-NCH-SiO
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Special Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
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AFM Probes
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