SSS-SEIH datasheet
AFM Probe Type: SSS-SEIH
Product Description:
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The probe offers unique features:
- excellent tip radius of curvature
- typical aspect ratio at 200 nm from tip apex in the order of 3:1
- monolithic material
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 225 µm(215 - 235 µm)* | 33 µm(30 - 45 µm)* | 5 µm(4 - 6 µm)* | 15 N/m(5 - 37 N/m)* | 130 kHz(96 - 175 kHz)* |
AFM Tips:
| Shape | Tip Radius | Half Cone Angles |
|---|---|---|
| Supersharp | <2 nm( < 5 nm guaranteed ) | < 10° at 200 nm from apex |
* guaranteed range
Coating:
NoneSensors Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
No taxes applied except 5% in South Carolina. |
