SCM-PIC datasheet
AFM Probe Type:
SCM-PIC
Original Manufacturer Type: CONTPt
Product Description:
NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 450 µm(445 - 455 µm)* | 50 µm(45 - 55 µm)* | 2 µm(1.5 - 2.5 µm)* | 0.2 N/m(0.07 - 0.4 N/m)* | 13 kHz(9 - 17 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Height |
|---|---|---|
| 1 | Standard | 10 - 15 µm* |
* - typical range
Coating:
The platinum iridium5 (PtIr5) coating on both sides of the probe allows electrical contacts between tip and sample (high conductivity) while enhancing the reflectivity of the cantilever. The typical tip radius of curvature is less than 25 nm.
Sensors Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
No taxes applied except 5% in South Carolina. |
