Q-CONT datasheet
AFM Probe Type:
Q-CONT
Premounted on a T-Plate for Quesant AFM systems
Product Description:
Rotated, monolithic silicon AFM probe for contact mode applications;Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Chipsize: 3.4 x 1.6 x 0.3 mm
Consistent high quality at a lower price!
Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ContAl AFM probe.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 450 µm(440 - 460 µm)* | 50 µm(45 - 55 µm)* | 2 µm(1 - 3 µm)* | 0.2 N/m(0.07 - 0.4 N/m)* | 13 kHz(9 - 17 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Set Back | Tip Radius | Half Cone Angles |
|---|---|---|---|---|
| Rotated | 17 µm(15 - 19 µm)* | 15 µm(10 - 20 µm)* | <10 nm | 20°-25° along cantilever axis 25°-30° from side 10° at the apex |
* typical range
Coating:
Aluminium reflex coating on detector side of the cantilever, 30 nm thickSensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock. |
Price Description: |
No taxes applied except 5% in South Carolina. |
