PPP-XYNCHR datasheet
AFM Probe Type: PPP-XYNCHR
Product Description:
As a matter of course, the features of the proven Point Probe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- Al coating on detector side of cantilever
- chemically inert
- high mechanical Q-factor for high sensitivity
- tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 125 µm(115 - 135 µm)* | 30 µm(22.5 - 37.5 µm)* | 4 µm(3 - 5 µm)* | 42 N/m(10 - 130 N/m)* | 330 kHz(204 - 497 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Radius |
|---|---|---|
| 1 | Standard | <7 nm( < 10 nm guaranteed ) |
* - guaranteed range
Coating:
Aluminium reflex coating on detector side of the cantileverSensors Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
No taxes applied except 5% in South Carolina. |
