Product Description:

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS^™ PPP-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

    This AFM probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - Al coating on detector side of cantilever
        - chemically inert
        - high mechanical Q-factor for high sensitivity

This product features alignment grooves on the backside of the holder chip.

Application Modes:

• Non-Contact / Tapping Mode AFM Probes

AFM Probe Specifications:

  AFM Cantilevers:

Cant.	Length	Width	Thickness	Force Const.	Res. Freq.
1	125 µm(115 - 135 µm)*	30 µm(22.5 - 37.5 µm)*	4 µm(3 - 5 µm)*	42 N/m(10 - 130 N/m)*	330 kHz(204 - 497 kHz)*

  AFM Tips:

on Cant.	Shape	Tip Radius
1	Standard	<7 nm( < 10 nm guaranteed )

* - guaranteed range

Coating:

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.

Sensors Datasheets:

Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.