PPP-FMAuD datasheet
AFM Probe Type: PPP-FMAuD
Product Description:
The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-FMAuD is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- Au coating on detector side of cantilever
- chemically inert
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 225 µm(215 - 235 µm)* | 30 µm(20 - 35 µm)* | 3 µm(2 - 4 µm)* | 2.8 N/m(0.5 - 9.5 N/m)* | 75 kHz(45 - 115 kHz)* |
AFM Tips:
| Shape | Tip Radius |
|---|---|
| Standard | <7 nm( < 10 nm guaranteed ) |
* guaranteed range
Coating:
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
No taxes applied except 5% in South Carolina. |
