PL2-NCH datasheet
AFM Probe Type: PL2-NCH
Product Description:
The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
NANOSENSORS™ PL2-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.
The probe offers unique features:
- plateau diameter of typically 1.8 µm
- single crystalline silicon
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
| Technical Data Tip | Value |
| Plateau diameter (*) /µm | 1.8±0.5 |
| Plateau rod height /µm | >2.0 |
| Plateau edge radius /µm | 0.2-0.4 |
| Tip height (overall) /µm | 10-15 |
* measured at a distance of 100nm from the end-face
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 125 µm(115 - 135 µm)* | 30 µm(22.5 - 37.5 µm)* | 4 µm(3 - 5 µm)* | 42 N/m(10 - 130 N/m)* | 330 kHz(204 - 497 kHz)* |
AFM Tips:
| Shape |
|---|
| Plateau |
* guaranteed range
Coating:
NonePurchasing Info:
Product Availability: |
From stock |
Price Description: |
No taxes applied except 5% in South Carolina. |
