| type |
manufacturer |
short description |
short specs: |
tip shape |
SSS-NCH |
 |
SuperSharp, Tapping Mode AFM Probe |
coating:None AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
Supersharp |
SSS-NCHR |
 |
SuperSharp, Tapping Mode AFM Probe |
coating:Reflex Aluminum AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
Supersharp |
SSS-NCL |
 |
SuperSharp, Tapping Mode AFM Probe with Long Cantilever |
coating:None AFM cantilever: length: 225 µm force const.: 48 N/m res. freq.: 190 kHz
|
Supersharp |
SSS-NCLR |
 |
SuperSharp, Tapping Mode AFM Probe with Long Cantilever |
coating:Reflex Aluminum AFM cantilever: length: 225 µm force const.: 48 N/m res. freq.: 190 kHz
|
Supersharp |
NW-SSS-NCH |
 |
SuperSharp, Tapping Mode AFM Probe |
coating:None AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
Supersharp |
TESP-SS |
 |
SuperSharp, Tapping Mode AFM Probe |
coating:None AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 320 kHz
|
Supersharp |
NW-SSS-NCL |
 |
SuperSharp, Tapping Mode AFM Probe with Long Cantilever |
coating:None AFM cantilever: length: 225 µm force const.: 48 N/m res. freq.: 190 kHz
|
Supersharp |
SSS-FM |
 |
SuperSharp, Force Modulation AFM Probe |
coating:None AFM cantilever: length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz
|
Supersharp |
SSS-FMR |
 |
SuperSharp, Force Modulation AFM Probe |
coating:Reflex Aluminum AFM cantilever: length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz
|
Supersharp |
SSS-SEIH |
 |
SuperSharp, Special Tapping Mode AFM Probe |
coating:None AFM cantilever: length: 225 µm force const.: 15 N/m res. freq.: 130 kHz
|
Supersharp |
NW-SSS-SEIH |
 |
SuperSharp, Special Tapping Mode AFM Probe |
coating:None AFM cantilever: length: 225 µm force const.: 15 N/m res. freq.: 130 kHz
|
Supersharp |
SSS-SEIHR |
 |
SuperSharp, Special Tapping Mode AFM Probe |
coating:Reflex Aluminum AFM cantilever: length: 225 µm force const.: 15 N/m res. freq.: 130 kHz
|
Supersharp |