| type |
manufacturer |
short description |
short specs: |
tip shape |
 SSS-NCH |
 |
SuperSharp, Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
Supersharp |
| SSS-NCHR |
|
SuperSharp, Tapping Mode AFM Probe |
coating:Reflex Aluminum
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
Supersharp |
| SSS-NCL |
|
SuperSharp, Tapping Mode AFM Probe with Long Cantilever |
coating:None
AFM cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
|
Supersharp |
| SSS-NCLR |
|
SuperSharp, Tapping Mode AFM Probe with Long Cantilever |
coating:Reflex Aluminum
AFM cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
|
Supersharp |
 NW-SSS-NCH |
 |
SuperSharp, Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
Supersharp |
| TESP-SS |
|
SuperSharp, Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
Supersharp |
| NW-SSS-NCL |
|
SuperSharp, Tapping Mode AFM Probe with Long Cantilever |
coating:None
AFM cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
|
Supersharp |
| SSS-FM |
|
SuperSharp, Force Modulation AFM Probe |
coating:None
AFM cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
Supersharp |
| SSS-FMR |
|
SuperSharp, Force Modulation AFM Probe |
coating:Reflex Aluminum
AFM cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
Supersharp |
| SSS-SEIH |
|
SuperSharp, Special Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 225 µm
force const.: 15 N/m
res. freq.: 130 kHz
|
Supersharp |
| NW-SSS-SEIH |
|
SuperSharp, Special Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 225 µm
force const.: 15 N/m
res. freq.: 130 kHz
|
Supersharp |
| SSS-SEIHR |
|
SuperSharp, Special Tapping Mode AFM Probe |
coating:Reflex Aluminum
AFM cantilever:
length: 225 µm
force const.: 15 N/m
res. freq.: 130 kHz
|
Supersharp |
