| type |
manufacturer |
short description |
short specs: |
tip shape |
 PPP-NCHPt |
 |
Electrical, Tapping Mode AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
Standard |
| PPP-NCLPt |
|
Electrical, Tapping Mode AFM Probe with a Long Cantilever |
coating:Electrically Conductive
AFM cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
|
Standard |
| PPP-NCSTPt |
|
Electrical, Soft Tapping Mode AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 150 µm
force const.: 7.4 N/m
res. freq.: 160 kHz
|
Standard |
| PPP-EFM |
|
Electrical, Force Modulation AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
Standard |
| PPP-CONTPt |
|
Electrical, Contact Mode AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
Standard |
| PPP-CONTSCPt |
|
Electrical, Contact Mode AFM Probe with Short Cantilever |
coating:Electrically Conductive
AFM cantilever:
length: 225 µm
force const.: 0.2 N/m
res. freq.: 23 kHz
|
Standard |
  ATEC-NCPt |
|
Electrical, Tapping Mode AFM Probe with a REAL Visible Tip |
coating:Electrically Conductive
AFM cantilever:
length: 160 µm
force const.: 45 N/m
res. freq.: 335 kHz
|
Visible |
| ATEC-EFM |
|
Electrical, Force Modulation AFM Probe with a REAL Visible Tip |
coating:Electrically Conductive
AFM cantilever:
length: 240 µm
force const.: 2.8 N/m
res. freq.: 85 kHz
|
Visible |
| ATEC-CONTPt |
|
Electrical, Contact Mode AFM Probe with a REAL Visible Tip |
coating:Electrically Conductive
AFM cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 15 kHz
|
Visible |
 ARROW-NCPt |
 |
Electrical, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever |
coating:Electrically Conductive
AFM cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz
|
Arrow |
| ARROW-EFM |
|
Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever |
coating:Electrically Conductive
AFM cantilever:
length: 240 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
Arrow |
 NCHPt |
|
Electrical, Tapping Mode AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
Standard |
| EFM |
|
Electrical, Force Modulation AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
Standard |
| SCM-PIT |
|
Electrical, Force Modulation AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
Standard |
| ARROW-CONTPt |
|
Electrical, Contact Mode AFM Probe with Tip at the Very End of the Cantilever |
coating:Electrically Conductive
AFM cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 14 kHz
|
Arrow |
| CONTPt |
|
Electrical, Contact Mode AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
Standard |
| SCM-PIC |
|
Electrical, Contact Mode AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
Standard |
 ElectriTap300 |
 |
Electrical, Tapping Mode AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 125 µm
force const.: 40 N/m
res. freq.: 300 kHz
|
Rotated |
| ElectriMulti75 |
|
Electrical, Force Modulation AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 225 µm
force const.: 3 N/m
res. freq.: 75 kHz
|
Rotated |
| ElectriMulti75-G |
|
Electrical, Force Modulation AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 225 µm
force const.: 3 N/m
res. freq.: 75 kHz
|
Rotated |
| ElectriCont |
|
Electrical, Contact Mode AFM Probe |
coating:Electrically Conductive
AFM cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
Rotated |
 CDTP-NCHR |
|
Diamond Coated, Conductive Tapping Mode AFM Probe |
coating:Conductive Diamond
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
Standard |
 CDT-NCHR |
|
Diamond Coated, Conductive Tapping Mode AFM Probe |
coating:Conductive Diamond
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
Standard |
| CDT-NCLR |
|
Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever |
coating:Conductive Diamond
AFM cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
|
Standard |
| CDT-FMR |
|
Diamond Coated, Conductive Force Modulation AFM Probe |
coating:Conductive Diamond
AFM cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
Standard |
| CDT-CONTR |
|
Diamond Coated, Conductive Contact Mode AFM Probe |
coating:Conductive Diamond
AFM cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
Standard |
 NW-CDT-NCHR |
|
Diamond Coated, Conductive Tapping Mode AFM Probe |
coating:Conductive Diamond
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
Standard |
| DDESP |
|
Diamond Coated, Conductive Tapping Mode AFM Probe |
coating:Conductive Diamond
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
Standard |
| NW-CDT-NCLR |
|
Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever |
coating:Conductive Diamond
AFM cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
|
Standard |
| NW-CDT-FMR |
|
Diamond Coated, Conductive Force Modulation AFM Probe |
coating:Conductive Diamond
AFM cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
Standard |
| DDESP-FM |
|
Diamond Coated, Conductive Force Modulation AFM Probe |
coating:Conductive Diamond
AFM cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
Standard |
| PPP-NCHAu |
|
Gold Coated Tapping Mode AFM Probe |
coating:Gold Overall
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
Standard |
| PPP-NCLAu |
|
Gold Coated Tapping Mode AFM Probe with Long Cantilever |
coating:Gold Overall
AFM cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
|
Standard |
| PPP-NCSTAu |
|
Gold Coated Soft Tapping Mode AFM Probe |
coating:Gold Overall
AFM cantilever:
length: 150 µm
force const.: 7.4 N/m
res. freq.: 160 kHz
|
Standard |
| PPP-FMAu |
|
Gold Coated Force Modulation AFM Probe |
coating:Gold Overall
AFM cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz
|
Standard |
| PPP-CONTAu |
|
Gold Coated Contact Mode AFM Probe |
coating:Gold Overall
AFM cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
Standard |
| PPP-CONTSCAu |
|
Gold Coated Contact Mode AFM Probe with Short Cantilever |
coating:Gold Overall
AFM cantilever:
length: 225 µm
force const.: 0.2 N/m
res. freq.: 23 kHz
|
Standard |
| ATEC-NCAu |
|
Gold Coated Tapping Mode AFM Probe with a REAL Visible Tip |
coating:Gold Overall
AFM cantilever:
length: 160 µm
force const.: 45 N/m
res. freq.: 335 kHz
|
Visible |
| ATEC-FMAu |
|
Gold Coated Force Modulation AFM Probe with a REAL Visible Tip |
coating:Gold Overall
AFM cantilever:
length: 240 µm
force const.: 2.8 N/m
res. freq.: 85 kHz
|
Visible |
| ATEC-CONTAu |
|
Gold Coated Contact Mode AFM Probe with a REAL Visible Tip |
coating:Gold Overall
AFM cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 15 kHz
|
Visible |
 Tap300GB |
|
Gold Coated Tapping Mode AFM Probe |
coating:Gold Overall
AFM cantilever:
length: 125 µm
force const.: 40 N/m
res. freq.: 300 kHz
|
Rotated |
| Multi75GB |
|
Gold Coated Force Modulation AFM Probe |
coating:Gold Overall
AFM cantilever:
length: 225 µm
force const.: 3 N/m
res. freq.: 75 kHz
|
Rotated |
| ContGB-G |
|
Gold Coated Contact Mode AFM Probe |
coating:Gold Overall
AFM cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz
|
Rotated |
 BudgetComboBox |
|
Mixed Box with 50 BudgetSensors AFM probes of your choice |
|
|
