AFM Probes

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AFM Probes for Electrical Force / Conductive (EFM, SCM, Tuna, SSR):

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Order Code	Description	Specs:

PPP-NCHPt

Electrical, Tapping Mode AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Standard
Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz

PPP-NCLPt

Electrical, Tapping Mode AFM Probe with a Long Cantilever

Coating:
Electrically Conductive
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz

PPP-NCSTPt

Electrical, Soft Tapping Mode AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Standard
Cantilever:
length: 150 µm
force const.: 7.4 N/m
res. freq.: 160 kHz

PPP-EFM

Electrical, Force Modulation AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz

PPP-CONTPt

Electrical, Contact Mode AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Standard
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz

PPP-CONTSCPt

Electrical, Contact Mode AFM Probe with Short Cantilever

Coating:
Electrically Conductive
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 0.2 N/m
res. freq.: 23 kHz

ATEC-NCPt

Electrical, Tapping Mode AFM Probe with a REAL Visible Tip

Coating:
Electrically Conductive
Tip Shape:
Visible
Cantilever:
length: 160 µm
force const.: 45 N/m
res. freq.: 335 kHz

ATEC-EFM

Electrical, Force Modulation AFM Probe with a REAL Visible Tip

Coating:
Electrically Conductive
Tip Shape:
Visible
Cantilever:
length: 240 µm
force const.: 2.8 N/m
res. freq.: 85 kHz

ATEC-CONTPt

Electrical, Contact Mode AFM Probe with a REAL Visible Tip

Coating:
Electrically Conductive
Tip Shape:
Visible
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 15 kHz

ARROW-NCPt

Electrical, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Coating:
Electrically Conductive
Tip Shape:
Arrow
Cantilever:
length: 160 µm
force const.: 42 N/m
res. freq.: 285 kHz

ARROW-EFM

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Coating:
Electrically Conductive
Tip Shape:
Arrow
Cantilever:
length: 240 µm
force const.: 2.8 N/m
res. freq.: 75 kHz

NCHPt

Electrical, Tapping Mode AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Standard
Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz

EFM

Electrical, Force Modulation AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz

SCM-PIT

Electrical, Force Modulation AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz

ARROW-CONTPt

Electrical, Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Coating:
Electrically Conductive
Tip Shape:
Arrow
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 14 kHz

CONTPt

Electrical, Contact Mode AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Standard
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz

SCM-PIC

Electrical, Contact Mode AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Standard
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz

ElectriTap300

Electrical, Tapping Mode AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Rotated
Cantilever:
length: 125 µm
force const.: 40 N/m
res. freq.: 300 kHz

ElectriTap190-G

Electrical, Tapping Mode AFM Probe with a Long Cantilever

Coating:
Electrically Conductive
Tip Shape:
Rotated
Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz

ElectriMulti75

Electrical, Force Modulation AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Rotated
Cantilever:
length: 225 µm
force const.: 3 N/m
res. freq.: 75 kHz

ElectriMulti75-G

Electrical, Force Modulation AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Rotated
Cantilever:
length: 225 µm
force const.: 3 N/m
res. freq.: 75 kHz

ElectriCont-G

Electrical, Contact Mode AFM Probe

Coating:
Electrically Conductive
Tip Shape:
Rotated
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz

CDTP-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating:
Conductive Diamond
Tip Shape:
Standard
Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz

CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating:
Conductive Diamond
Tip Shape:
Standard
Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz

CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

Coating:
Conductive Diamond
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz

CDT-FMR

Diamond Coated, Conductive Force Modulation AFM Probe

Coating:
Conductive Diamond
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz

CDT-CONTR

Diamond Coated, Conductive Contact Mode AFM Probe

Coating:
Conductive Diamond
Tip Shape:
Standard
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz

NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating:
Conductive Diamond
Tip Shape:
Standard
Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz

DDESP

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating:
Conductive Diamond
Tip Shape:
Standard
Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz

NW-CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

Coating:
Conductive Diamond
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz

NW-CDT-FMR

Diamond Coated, Conductive Force Modulation AFM Probe

Coating:
Conductive Diamond
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz

DDESP-FM

Diamond Coated, Conductive Force Modulation AFM Probe

Coating:
Conductive Diamond
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz

PPP-NCHAu

Gold Coated Tapping Mode AFM Probe

Coating:
Gold Overall
Tip Shape:
Standard
Cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz

PPP-NCLAu

Gold Coated Tapping Mode AFM Probe with Long Cantilever

Coating:
Gold Overall
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz

PPP-NCSTAu

Gold Coated Soft Tapping Mode AFM Probe

Coating:
Gold Overall
Tip Shape:
Standard
Cantilever:
length: 150 µm
force const.: 7.4 N/m
res. freq.: 160 kHz

PPP-FMAu

Gold Coated Force Modulation AFM Probe

Coating:
Gold Overall
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 2.8 N/m
res. freq.: 75 kHz

PPP-CONTAu

Gold Coated Contact Mode AFM Probe

Coating:
Gold Overall
Tip Shape:
Standard
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz

PPP-CONTSCAu

Gold Coated Contact Mode AFM Probe with Short Cantilever

Coating:
Gold Overall
Tip Shape:
Standard
Cantilever:
length: 225 µm
force const.: 0.2 N/m
res. freq.: 23 kHz

ATEC-NCAu

Gold Coated Tapping Mode AFM Probe with a REAL Visible Tip

Coating:
Gold Overall
Tip Shape:
Visible
Cantilever:
length: 160 µm
force const.: 45 N/m
res. freq.: 335 kHz

ATEC-FMAu

Gold Coated Force Modulation AFM Probe with a REAL Visible Tip

Coating:
Gold Overall
Tip Shape:
Visible
Cantilever:
length: 240 µm
force const.: 2.8 N/m
res. freq.: 85 kHz

ATEC-CONTAu

Gold Coated Contact Mode AFM Probe with a REAL Visible Tip

Coating:
Gold Overall
Tip Shape:
Visible
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 15 kHz

Tap300GB

Gold Coated Tapping Mode AFM Probe

Coating:
Gold Overall
Tip Shape:
Rotated
Cantilever:
length: 125 µm
force const.: 40 N/m
res. freq.: 300 kHz

Multi75GB-G

Gold Coated Force Modulation AFM Probe

Coating:
Gold Overall
Tip Shape:
Rotated
Cantilever:
length: 225 µm
force const.: 3 N/m
res. freq.: 75 kHz

ContGB-G

Gold Coated Contact Mode AFM Probe

Coating:
Gold Overall
Tip Shape:
Rotated
Cantilever:
length: 450 µm
force const.: 0.2 N/m
res. freq.: 13 kHz

BudgetComboBox

Mixed Box with 50 BudgetSensors AFM probes of your choice

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Call us:+ 49 (0) 6441 870 6272 Wetzlar, Germany
- tel: + 49 (0) 6441 870 6272
- fax: + 49 (0) 6441 870 6274
- info@nanoandmore.com
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AFM Probes, Tips, Cantilevers

AFM Probes

AFM Probes for Electrical Force / Conductive (EFM, SCM, Tuna, SSR):