Product Description:

EBD HCD on single AFM cantilever. Each tip is SEM inspected.
The U1 tip is intended to be used for flat samples and for applications with considerably high lateral shear forces, which may break longer tips. Image quality is surprisingly high. The high aspect ratio enables precise measurements of vertical structures and improves on the lateral resolution as well.
Tip Height > 300 nm +/- 100 nm, Diameter < 50 nm, tip radius < 10 nm, tip half cone angle: < 4°The HDC material itself is hydrophobic - extremely useful for scanning in liquids and for applications in biology and medicine. No tip degradation while scanning and by the tip approach, even on hard samples like SiO2 and Ti.

Application Modes:

• Trench Measurement / High Aspect Ratio AFM Tips

Coating:

Different metal and dielectrical coatings available. Please contact us for further informations.

Sensors Datasheets:

On request we characterize every single, individual tip by high resolution SEM. Let us know, which datas you are intrested in: HDC-tip length, -diameter, -radius, half cone angle, -tilt angle, -aspect ratio. Price for a certificate, per tip: 80 EUR