TESP-SS datasheet
AFM Probe Type:
TESP-SS
Original Manufacturer Type: NW-SSS-NCH
Product Description:
NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.
This probe offers unique features:
- guaranteed tip radius of curvature 5 nm (yield >80%)
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 125 µm(120 - 130 µm)* | 30 µm(25 - 35 µm)* | 4 µm(3.5 - 4.5 µm)* | 42 N/m(21 - 78 N/m)* | 320 kHz(250 - 390 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Radius | Half Cone Angles |
|---|---|---|---|
| Supersharp | 10 - 15 µm* | <2 nm( < 5 nm guaranteed ) | < 10° at the last 200 nm of the tip |
* typical range
Coating:
None
Sensors Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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