AFM Tip SSS-QMFMR

SSS-QMFMR datasheet

manufacturer:

www.nanosensors.com

View this AFM Tip
on manufacturer's website

AFM Probe Type: SSS-QMFMR

Product Description:

The NANOSENSORS™ SSS-QMFMR AFM probe combines the high resolution performance of the SuperSharpSilicon™ magnetic force microscopy probe with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. An extremely small radius of the coated tip, a high aspect ratio at the last few hundred nanometers of the tip and a Q-factor of more than 35,000 facilitates outstanding lateral resolution in the magnetic force image and high operation stability under UHV conditions.
Due to the low magnetic moment of the tip the sensitivity to magnetic forces is decreased if compared to standard MFM probe but the disturbance of soft magnetic samples is also reduced.

    The SPM probe offers unique features:
        - hard magnetic coating on the tip side (coercivity of app. 125 Oe, remanence magnetization
          of app. 80 emu/cm3)
        - effective magnetic moment 0.25x of standard probes
        - metallic electrical conductivity
        - excellent tip radius of curvature
        - magnetic resolution better than 25 nm
        - Al coating on detector side of cantilever enhancing the reflectivity of the laser beam
          by a factor of about 2.5
        - excellent mechanical Q-factor under UHV conditions for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.

This product features alignment grooves on the backside of the holder chip.

Application Modes:

Magnetic Force AFM Probes (MFM)

AFM Probe Specifications:

AFM Cantilevers:

Shape	Length	Width	Thickness	Force Const.	Res. Freq.
beam	225 µm(215 - 235 µm)*	28 µm(20 - 35 µm)*	3 µm(2 - 4 µm)*	2.8 N/m(0.5 - 9.5 N/m)*	75 kHz(45 - 115 kHz)*

AFM Tips:

Shape
Supersharp

* guaranteed range

Coating:

The hard magnetic coating on the tip is characterized by a coercivity of app. 125 Oe and a remanence magnetization of app. 80 emu/cm3 (these values were determined on a flat surface).

Sensors Datasheets:

Datasheet for all AFM probes with sets of 10 probes.

Purchasing Info:

Product Availability:	From stock
Price Description:	Does not include VAT or customs duties.Include shipping within the EU for orders with an order value of more than 500,- €.