SSS-MFMR datasheet
AFM Probe Type: SSS-MFMR
Product Description:
Due to the low magnetic moment of the tip the sensitivity to magnetic forces is significantly decreased if compared to standard MFM probes but the disturbance of soft magnetic samples is also reduced.
The SPM probe offers unique features:
- hard magnetic coating on the tip side (coercivity of app. 125 Oe, remanence magnetization
of app. 80 emu/cm3)
- effective magnetic moment 0.25x of standard probes
- metallic electrical conductivity
- excellent tip radius of curvature
- magnetic resolution better than 25 nm
- Al coating on detector side of cantilever enhancing the reflectivity of the laser beam
by a factor of about 2.5
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 225 µm(215 - 235 µm)* | 28 µm(20 - 35 µm)* | 3 µm(2 - 4 µm)* | 2.8 N/m(0.5 - 9.5 N/m)* | 75 kHz(45 - 115 kHz)* |
AFM Tips:
| Shape |
|---|
| Supersharp |
* guaranteed range
Coating:
Sensors Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties.Include shipping within the EU for orders with an order value of more than 500,- €. |
Terms and Conditions for NANOSENSORS