Product Description:

SuperSharp Enhanced

SuperSharp, long lifetime probe for very fine features.

2 nm tip radius, high resolution probe with excellent lifetime and reliability. The nanotools® SSE_NCHR_13 tip is designed for non-contact/high frequency mode. It delivers outstanding resolution and image stability in critical AFM applications even on hard, tip eating samples like ceramics, silicon oxide/nitride, polysilicon to name a few.

The tip end is made from HIGH-DENSITY, DIAMOND LIKE CARBON (HDC/DLC), thus offering the extreme durability of diamond together with high resolution imaging capability. The stiffness/Youngs modulus is 8 x of that of silicon. Applying our patented EBD (electron beam deposition) technique we ensure a stiff and rigid probe of nanometer precision.

-       EBD tip on pointprobe NCHR/TESPA AFM cantilever

-       excellent tip radius: < 5 nm, typically 2 nm

-       tip shape: conical, rotation-symmetric

-       100 % SEM check; good tip guarantee.

-       high mechanical Q-factor for high sensitivity

-       fits into automated AFM tools (in fab/in line)

This product features alignment grooves on the backside of the holder chip.

Application Modes:

• Diamond AFM Probes
• Enhanced Wear Resistance Non-Conductive
• Enhanced Resolution AFM Tips (Supersharp)

Coating:

Aluminum reflective coating on the detector side of the cantilever.
The Al reflective coating increases the laser signal by a factor of about 2.5.
In particular it is recommended for highly reflective samples and machine vision applications.

Sensors Datasheets:

included