SC-35-LM datasheet
manufacturer:
AFM Probe Type: SC-35-LM
Product Description:
The SC-35-LM is a low moment probe designed for the imaging of soft magnetic samples and other applications that required a reduced tip field. By the use of Side Coating in combination with a low magnetization coating, the tip field is low and confined to the tip apex. The SC-35-LM is the ideal probe to study domain patterns in soft magnetic media while maintaining good topographic resolution.
Tip radius < 40 nm
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Length | Force Const. | Res. Freq. |
|---|---|---|
| 225 µm | 2.8 N/m | 75 kHz |
AFM Tips:
| Shape | Tip Radius |
|---|---|
| Pyramid | <40 nm |
* typical range
Coating:
"Hard magnetic, low momentum coating on tip side of the cantilever: CoNi; 35 nm thick; Oe> 400; Magnetizatio < 50 kA/m; Typical magn. Resolution < 30 nm; Backside Al reflex coating"
Sensors Datasheets:
Not available
Purchasing Info:
Product Availability: |
5 working days ARO EXW Wetzlar |
Price Description: |
Does not include VAT or customs duties. |
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