SC-20-M datasheet
manufacturer:
AFM Probe Type: SC-20-M
Product Description:
The SC-20-M is SmartTip®s improved resolution side coated MFM probe. Compared to the standard SC-35-M probe it trades signal strength for improved resolution. It is therefore most suitable for high resolution measurements on hard magnetic samples. By the use of Side Coating technology the sharpness of the probe is maintained to combine good topographic resolution with high magnetic resolution and stability.
Tip Radius < 35 nm
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Length | Force Const. | Res. Freq. |
|---|---|---|
| 225 µm | 2.8 N/m | 75 kHz |
AFM Tips:
| Shape | Tip Radius |
|---|---|
| Pyramid | <35 nm |
* typical range
Coating:
"Hard magnetic, high momentum coating on tip side of the cantilever: CoNi; 20 nm thick; Oe> 1000; Magnetizatio ~ 1100 kA/m; Typical magn. Resolution < 25 nm; "
Sensors Datasheets:
Not available
Purchasing Info:
Product Availability: |
5 working days ARO EXW Wetzlar |
Price Description: |
Does not include VAT or customs duties. |
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