SC-20-LM datasheet
manufacturer:
AFM Probe Type: SC-20-LM
Product Description:
The SC-20-LM is similar to the SC-35-LM, but to further increase the resolution and decrease the tip field, the coating thickness has been reduced. This is the ideal tip for very sensitive samples, where the magnetic state of the sample can be easily influenced by the tip strayfield.
Tip Radius < 40 nm
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Length | Force Const. | Res. Freq. |
|---|---|---|
| 225 µm | 2.8 N/m | 75 kHz |
AFM Tips:
| Shape | Tip Radius |
|---|---|
| Pyramid | <40 nm |
* typical range
Coating:
"Hard magnetic, low momentum coating on tip side of the cantilever: CoNi; 20 nm thick; Oe> 400; Magnetizatio < 50 kA/m; Typical magn. Resolution < 25 nm; "
Sensors Datasheets:
Not available
Purchasing Info:
Product Availability: |
5 working days ARO EXW Wetzlar |
Price Description: |
Does not include VAT or customs duties. |
Terms and Conditions for SmartTip