PPP-XYCONTR datasheet
AFM Probe Type: PPP-XYCONTR
Product Description:
As a matter of course, the features of the proven Point Probe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- Al coating on detector side of cantilever
- chemically inert
- high mechanical Q-factor for high sensitivity
- tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 450 µm(440 - 460 µm)* | 50 µm(42.5 - 57.5 µm)* | 2 µm(1 - 3 µm)* | 0.2 N/m(0.02 - 0.77 N/m)* | 13 kHz(6 - 21 kHz)* |
AFM Tips:
| Shape | Tip Radius |
|---|---|
| Standard | <7 nm( < 10 nm guaranteed ) |
* guaranteed range
Coating:
Sensors Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |

