PPP-NCSTAuD datasheet
AFM Probe Type: PPP-NCSTAuD
Product Description:
The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCSTAuD AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- Au coating on detector side of cantilever
- chemically inert
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 150 µm(140 - 160 µm)* | 27 µm(19.5 - 34.5 µm)* | 2.8 µm(1.8 - 3.8 µm)* | 7.4 N/m(1.2 - 29 N/m)* | 160 kHz(75 - 265 kHz)* |
AFM Tips:
| Shape | Tip Radius |
|---|---|
| Standard | <7 nm( < 10 nm guaranteed ) |
* guaranteed range
Coating:
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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