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NANOSENSORS™ PPP-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
This product features alignment grooves on the backside of the holder chip.
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 225 µm(215 - 235 µm)* | 38 µm(30 - 45 µm)* | 7 µm(6 - 8 µm)* | 48 N/m(21 - 98 N/m)* | 190 kHz(146 - 236 kHz)* |
| Shape | Tip Radius |
|---|---|
| Standard | <7 nm( < 10 nm guaranteed ) |
* guaranteed range
Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |