PPP-MFMR datasheet
AFM Probe Type: PPP-MFMR
Product Description:
The SPM probe offers unique features:
- hard magnetic coating on the tip side (coercivity of app. 300 Oe, remanence magnetization
of app. 300 emu/cm3)
- effective magnetic moment in the order of 1013 emu
- metallic electrical conductivity
- excellent tip radius of curvature
- magnetic resolution better than 50 nm
- Al coating on detector side of cantilever enhancing the reflectivity of the laser beam
by a factor of about 2.5
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
As both coatings are almost stress free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 225 µm(215 - 235 µm)* | 28 µm(20 - 35 µm)* | 3 µm(2 - 4 µm)* | 2.8 N/m(0.5 - 9.5 N/m)* | 75 kHz(45 - 115 kHz)* |
AFM Tips:
| Shape |
|---|
| Standard |
* guaranteed range
Coating:
Sensors Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties.Include shipping within the EU for orders with an order value of more than 500,- €. |
Terms and Conditions for NANOSENSORS