PPP-CONTAuD datasheet
AFM Probe Type: PPP-CONTAuD
Product Description:
NANOSENSORS™ PPP-CONTAuD probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- Au coating on detector side of cantilever
- chemically inert
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 450 µm(440 - 460 µm)* | 50 µm(42.5 - 57.5 µm)* | 2 µm(1 - 3 µm)* | 0.2 N/m(0.02 - 0.77 N/m)* | 13 kHz(6 - 21 kHz)* |
AFM Tips:
| Shape | Tip Radius |
|---|---|
| Standard | <7 nm( < 10 nm guaranteed ) |
* guaranteed range
Coating:
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
Terms and Conditions for NANOSENSORS