PNP-TR datasheet
AFM Probe Type: PNP-TR
Product Description:
NanoWorld Pyrex-Nitride probes are designed for various imaging applications in contact or dynamic mode.
The Pyrex-Nitride probes have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips. The tip is located 4 µm behind the free end of the cantilever. The probe series features a support chip that is made of Pyrex. The TR series features two different triangular cantilevers. Both sides of the chip have identical cantilevers. All cantilevers are stress compensated and have a 65 nm chromium / gold backside coating for high laser reflectivity.
All chips are pre-separated prior to shipment and come in Gel-Pak containers. Additionally this probe offers an excellent tip radius of curvature. The cantilever bending is below 2°.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|---|
| 1 | triangle | 200 µm | 28 µm | 600 µm | 0.08 N/m | 17 kHz |
| 2 | triangle | 100 µm | 13.5 µm | 600 µm | 0.32 N/m | 67 kHz |
AFM Tips:
| on Cant. | Shape | Tip Height | Tip Radius |
|---|---|---|---|
| 1 | Pyramid | 3.5 µm | <10 nm |
| 2 | Pyramid | 3.5 µm | <10 nm |
* typical range
Coating:
All cantilevers are stress compensated and have a 65 nm chromium / gold backside coating for high laser reflectivity.
Purchasing Info:
Product Availability: |
From Stock |
Price Description: |
Does not include VAT or customs duties. |
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