PNP-DB datasheet
AFM Probe Type: PNP-DB
Product Description:
The Pyrex-Nitride probes have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips. The tip is located 4µm behind the free end of the cantilever. This probe series features a support chip that is made of Pyrex. Two chip versions are available: The DB series with rectangular / diving board cantilevers and the TR series having triangular cantilevers. Both sides of the chip have identical cantilevers. All cantilevers are stress compensated and have a 70 nm chromium / gold backside coating for high laser reflectivity.
All chips are pre-separated prior to shipment and come in Gel-Pak containers.
Additionally this probe offers an excellent tip radius of curvature. The cantilever bending is below 2°.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|---|
| beam | 200 µm | 40 µm | 600 µm | 0.06 N/m | 17 kHz | |
| beam | 100 µm | 40 µm | 600 µm | 0.48 N/m | 67 kHz |
AFM Tips:
| on Cant. | Shape | Tip Height | Tip Radius |
|---|---|---|---|
| Pyramid | 3.5 µm | <10 nm | |
| Pyramid | 3.5 µm | <10 nm |
* typical range
Coating:
Chromium/Gold reflex coating on detector side of the cantilever
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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