PL2-CONT datasheet
AFM Probe Type: PL2-CONT
Product Description:
The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
NANOSENSORS™ PL2-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request
The probe offers unique features:
- plateau diameter of typically 1.8 µm
- single crystalline silicon
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
| Technical Data Tip | Value |
| Plateau diameter (*) /µm | 1.8±0.5 |
| Plateau rod height /µm | >2.0 |
| Plateau edge radius /µm | 0.2-0.4 |
| Tip height (overall) /µm | 10-15 |
* measured at a distance of 100nm from the end-face
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 450 µm(440 - 460 µm)* | 50 µm(42.5 - 57.5 µm)* | 2 µm(1 - 3 µm)* | 0.2 N/m(0.02 - 0.77 N/m)* | 13 kHz(6 - 21 kHz)* |
AFM Tips:
| Shape |
|---|
| Plateau |
* guaranteed range
Coating:
None
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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