NCSTR datasheet
AFM Probe Type: NCSTR
Product Description:
NanoWorld Pointprobe® NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, tip and sample wear could be significantly decreased.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 150 µm(145 - 155 µm)* | 27 µm(22 - 32 µm)* | 2.8 µm(2.3 - 3.3 µm)* | 7.4 N/m(3 - 16 N/m)* | 160 kHz(120 - 205 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Radius |
|---|---|---|
| Standard | 12.5 µm(10 - 15 µm)* | <8 nm( < 12 nm guaranteed ) |
* typical range
Coating:
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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