Multi75Al-G datasheet
AFM Probe Type: Multi75Al-G
Product Description:
Rotated, monolithic silicon AFM probe for force modulation and pulsed force mode (PFM);
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Chipsize: 3.4 x 1.6 x 0.3 mm
Consistent high quality at a lower price!
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 225 µm(215 - 235 µm)* | 28 µm(23 - 33 µm)* | 3 µm(2 - 4 µm)* | 3 N/m(1 - 7 N/m)* | 75 kHz(60 - 90 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Set Back | Tip Radius | Half Cone Angles |
|---|---|---|---|---|
| Rotated | 17 µm(15 - 19 µm)* | 15 µm(10 - 20 µm)* | <10 nm | 20°-25° along cantilever axis 25°-30° from side 10° at the apex |
* typical range
Coating:
Aluminium reflex coating on detector side of the cantilever, 30 nm thick
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock. |
Price Description: |
* FREE for orders valued more than 500 EUR. |
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