MFMR datasheet
AFM Probe Type: MFMR
Product Description:
NanoWorld Pointprobe® MFM probes are designed for magnetic force microscopy. The force constant and the special hard magnetic tip-side coating of the MFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping™ and lift mode operation. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Additionally this probe offers unique features:
- excellent tip radius of curvature
- high magnetic contrast and lateral resolution < 100 nm
- electrically conductive coating
Soft magnetic samples may be influenced by the tip magnetization!
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 225 µm(220 - 230 µm)* | 28 µm(22.5 - 32.5 µm)* | 3 µm(2.5 - 3.5 µm)* | 2.8 N/m(1.2 - 5.5 N/m)* | 75 kHz(60 - 90 kHz)* |
AFM Tips:
| Shape | Tip Height |
|---|---|
| Standard | 10 - 15 µm* |
* typical range
Coating:
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.
Sensors Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
Terms and Conditions for NanoWorld