LRCH-225C3_0-R datasheet
manufacturer:
AFM Probe Type: LRCH-225C3_0-R
Product Description:
LRCH = Large radius hemispherical tip
These tips are well suited for step height measurements over large scan areas. Due to the defined hemispherical tip shape, another ideal application is material characterization by nanoindentation (bio-medical materials).
All probe tips are SEM quality inspected prior to shipment (micrographs upon request).
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Force Const. | Res. Freq. |
|---|---|---|---|---|
| beam | 225 µm(210 - 240 µm)* | 35 µm(32 - 38 µm)* | 3 N/m | 75 kHz |
AFM Tips:
| Shape | Tip Radius | Full Cone Angles |
|---|---|---|
| Cone Shaped | <750 nm | 45° |
* typical range
Coating:
All Team Nanotec cantilevers are shipped with Aluminium - reflex coating (R). Without or special coating upon request.
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
Contact us for availability |
Price Description: |
Does not include VAT or customs duties. |
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