ISC-225C3_0-R datasheet
manufacturer:
AFM Probe Type: ISC-225C3_0-R
Product Description:
ISC = Improved Super Cone
Multipurpose tip for simultaneous measurement of roughness and large step height. The tip has a fully rotational symmetry and is designend for non-contact- / tapping-mode, high resonance frequency mode. The ISC type offers an outstanding high perfomance. Each tip is SEM quality controled.
Length of the high aspect ratio portio of the tip > 7 μm; total tip height: > 9 μm. These tips with appropriate coatings are also the base for Team Nanotec's MFM and EFM tips. Team Nanotec also offer the development and manufacturing of customized shapes and coatings.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Force Const. | Res. Freq. |
|---|---|---|---|---|
| beam | 225 µm(210 - 240 µm)* | 35 µm(32 - 38 µm)* | 3 N/m | 75 kHz |
AFM Tips:
| Shape | Tip Radius | Full Cone Angles | Half Cone Angles |
|---|---|---|---|
| High-Aspect-Ratio | <10 nm | < 10° for > 3 microns | < 5° |
* typical range
Coating:
All Team Nanotec cantilevers are shipped with Aluminium - reflex coating (R). Without or special coating upon request.
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
Contact us for availability |
Price Description: |
Does not include VAT or customs duties. |
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