ElectriTap300 datasheet
AFM Probe Type: ElectriTap300
Product Description:
Rotated, monolithic silicon AFM probe with symmetric tip shape, designed for non-contact high frequency applications (intermittent contact, tapping in air) and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Chipsize: 3.4 x 1.6 x 0.3 mm
Consistent high quality at a lower price!
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Chipsize: 3.4 x 1.6 x 0.3 mm
Consistent high quality at a lower price!
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 125 µm(115 - 135 µm)* | 30 µm(25 - 35 µm)* | 4 µm(3 - 5 µm)* | 40 N/m(20 - 75 N/m)* | 300 kHz(200 - 400 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Set Back | Tip Radius | Half Cone Angles |
|---|---|---|---|---|
| Rotated | 17 µm(15 - 19 µm)* | 15 µm(10 - 20 µm)* | <25 nm | 20°-25° along cantilever axis 25°-30° from side 10° at the apex |
* typical range
Coating:
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock. |
Price Description: |
Does not include VAT or customs duties. |
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